When it comes to the manufacturing of band material such as foils it is essential to deliver an error-free quality to the end customers to avoid returns and expensive reworking. To achieve this, it is required to analyze the foil’s surfaces dependably on defects already in the production and to initiate quality-ensuring activities in time. With the inspections system by R.A.M. GmbH, Germany, in which frame grabbers and software by Silicon Software are integrated, foils can be analyzed area-wide with
high resolution, detected defects be differentiated reliably and analyzed in real-time and therefore the processes in the production be optimized.
