EMVA organizes Machine Vision Presentation Forum during Measurement World Exhibition in Paris
- Series of speeches on machine vision topics during first two trade show days
- Several EMVA member companies exhibit with their own booth
Barcelona/Paris, 05 September, 2019. EMVA is pleased to announce that it will contribute to the machine vision presence during the exhibition Measurement World with a presentation forum. The new biannual exhibition format Measurement World is dedicated to measurement in its broadest sense and takes place from September 24 – 26 in hall 4 at Paris Expo Port de Versailles. The machine vision presentations are given in French or English and free of charge for all visitors and will be held on Tuesday, 24 September from 2.00 pm – 5.00 pm and on Wednesday, 25 September from 9.30 am – 12.00 pm in ROOM 1 of hall 4.
Presentation topics include state of the art vision technology; the description of concrete machine vision applications in different industrial sectors; machine vision standards and their objectives as well as the description of the vision markets in France, in Europe and worldwide. Below the timetable including the presentation titles:
Tuesday, 24 September
| 14:00 – 14:30 | EMVA: Presentation and numbers
Jean CARON – Michel OLLIVIER – Members of the EMVA Board |
| 14:30 – 15:00 | State of the art of visible Machine Vision sensors
Yvan EILERS – SVS-VISTEK |
| 15:00 – 15:30 | Artificial Intelligence on edge devices for machine vision applications
Boris DUCHE – IDS |
| 15:30 – 16:00 | Illumination techniques for new vision applications (Hyperspectral, SWIR, 3D…)
Arnaud MESTIVIER – EFFILUX |
| 16:00 – 16:30 | How to use the Sony polarized camera technology for complex applications and open new fields for inspection?
Pascal CHEVALIER – I2S / Stéphane CLAUSS – SONY |
| 16:30 – 17:00 | Embedded vision : from optimization to miniaturization, key factors to succeed in the development of your applications
Elodie Rigaudiere / TECHWAY |
Wednesday, 25 September
| 9:30 – 10:00 | EMVA: Machine Vision standards
Jean CARON – Michel OLLIVIER – Members of the EMVA Board |
| 10:00 – 10:30 | Multiple object tracking, a challenge for machine vision
Romain BAUDE – APREX SAS |
| 10:30 – 11:00 | How to innovate and create value with public research?
Rodolphe BERNARD – INSAVALOR |
| 11:00 – 11:30 | Expand the reach of your inspection systems with infrared imaging technologies
Sébastien FRASSE-SOMBET – LYNRED (SOFRADIR/ULIS) |
| 11:30 – 12:00 | XRAY tomography services the industrial world
Laura CREON – SEMATEC |
EMVA members at Measurement World
Several EMVA members will exhibit at Measurement World with their own booths. These are ATD Electronique, Carl Zeiss, Edmund Optics GmbH, EFFILUX, IDS – Imaging Development Systems, Mettler Toledo, Precitec, Stemmer Imaging, SVS Vistek, and VS Technology. Furthermore, in addition to their trade fair booth ATD Electronique announced that the company offers its own conference program. More details on the program and how to register can be found on their websites www.atdelectronique.com/event-shows.
About EMVA:
Founded in May 2003 in Barcelona, the European Machine Vision Association currently has about 120+ members representing more than 20 nations. Its aim is to promote the development and use of machine vision technology and to support the interests of its members – machine vision companies, research institutions and national machine vision associations. The main fields of work of EMVA are: standardization, statistics, the annual EMVA Business Conference and other networking events, European research funding, public relations and marketing. To find out more visit the web site www.emva.org.
