Sick IVP's 120-UV Flex vision sensor solves problems associated with inspecting deep blue solar cells
Sick IVP AB has a added a new product to its Inspector family. According to the firm, it is ideal for inspecting the edges of light-absorbing, deep blue solar wafers.
Although 2D vision sensors, with an integrated LED ring light, deliver excellent performance for grey, etched wafers, Sick IVP says that its latest product, the Inspector I20-UV Flex, is highly reliable when it comes to deep blue, coated solar wafers.
The manufacturing of the solar cells involves a series of complex operations. In various wet-chemical, plasma and thermal processes, different layers are applied to the silicon substrate. Because solar cells are very thin (with a thickness of about 180 µm), the risk of damage is high. At the same time, the characteristics of a solar wafer's surface changes in nearly every processing step - from a silvery gleam to almost black with a mono-crystalline or polycrystalline structure.
Solar cells are designed to absorb as much light as possible. The high light absorption makes it difficult to set up a vision system that creates a good contrast between the inspected object and the background, if traditional visible light sources, such as red or white LEDs, are used. The 120-UV Flex is able to solve such a problem, says the company.
With its integrated illumination unit, image evaluation and Ethernet interface this compact and reliable system is also easy to set up and use in an industrial environment. Successful pilot installations that use the Inspector 120-UV prove that damaged wafers are detected reliably and rejected in time.
Contact:
Sick IVP AB
Wallenbergs gata 4
SE-583 35 Linköping
Sweden
Phone: +46-1336-2100
Fax: +46-1321-1345
http://www.sick.se
http://www.sick.com/
Although 2D vision sensors, with an integrated LED ring light, deliver excellent performance for grey, etched wafers, Sick IVP says that its latest product, the Inspector I20-UV Flex, is highly reliable when it comes to deep blue, coated solar wafers.
The manufacturing of the solar cells involves a series of complex operations. In various wet-chemical, plasma and thermal processes, different layers are applied to the silicon substrate. Because solar cells are very thin (with a thickness of about 180 µm), the risk of damage is high. At the same time, the characteristics of a solar wafer's surface changes in nearly every processing step - from a silvery gleam to almost black with a mono-crystalline or polycrystalline structure.
Solar cells are designed to absorb as much light as possible. The high light absorption makes it difficult to set up a vision system that creates a good contrast between the inspected object and the background, if traditional visible light sources, such as red or white LEDs, are used. The 120-UV Flex is able to solve such a problem, says the company.
With its integrated illumination unit, image evaluation and Ethernet interface this compact and reliable system is also easy to set up and use in an industrial environment. Successful pilot installations that use the Inspector 120-UV prove that damaged wafers are detected reliably and rejected in time.
Contact:
Sick IVP AB
Wallenbergs gata 4
SE-583 35 Linköping
Sweden
Phone: +46-1336-2100
Fax: +46-1321-1345
http://www.sick.se
http://www.sick.com/
