On April 2nd it’s that time again: inVISION Day Metrology 2025 – the digital conference for Metrology and NDT – opens its virtual doors!

Experience twelve exciting presentations from leading companies such as Mahr, Zeiss and Photoneo…, which present the latest trends in 3D scanners, inline metrology, surface metrology and CT/X-Ray.
A highlight of the event is the keynote “Unconventional Optical Metrology – New Possibilities Beyond Classical Systems”, presented by Fraunhofer IPM. And that’s not all! At the end of the conference, the panel discussion “Virtual Clamping – The End of Physical Measurement Fixtures?” awaits you. Take the opportunity to ask your questions and discuss with experts.

In addition, as part of EMVA Innovations, the EMVA is introducing four companies that will present their latest technologies in short, inspiring presentations.