Copenhagen, 2019 – The EMVA Young Professional Award 2019 goes to Dr. Johannes Meyer, for his work “Light Field Methods for the Visual Inspection of Transparent Objects”. Johannes Meyer, age 31, received his Bachelor’s and Master’s degree in computer science from the Karlsruhe Institute of Technology KIT (Germany) in 2012, respectively, in 2014. He has been working as a research scientist in close cooperation between the Vision and Fusion Laboratory of the KIT and the Visual Inspection Systems department of the Fraunhofer-Institute of Optronics, System Technologies and Image Exploitation IOSB (Germany). In 2018, he obtained a PhD in computer science from the KIT. Since 2019 he is working for ITK Engineering GmbH in the field of computer vision.
